Bruker AXS Awards $6000 X-ray Diffraction Scholarship at Materials Research Society Fall Meeting in Boston

    University of Montreal Ph.D. Student is Runner-Up

    BOSTON, November 28 /CNW/ - During the 2007 Materials Research Society
Fall Meeting now taking place at the Hynes Convention Center in Boston, Bruker
AXS, a leading global provider of advanced X-ray solutions for life and
advanced materials sciences, announced the recipient of its 2007 Excellence in
X-ray Diffraction (XRD) scholarship -- based on unique experiments performed
by university students. Recognizing academic achievement in advanced XRD,
Bruker AXS yesterday presented its $6,000 scholarship for the most unique
application in the field of materials research.

    This year the annual Bruker AXS XRD $6,000 scholarship has gone to Ph.D.
student Michelene E. Miller at Alfred University for her research paper "Novel
Processing of Microporous Glass-Ceramics for Gas Separation." She is advised
by Dr. Scott T. Misture, Professor of Materials Science at the New York State
College of Ceramics at Alfred University in Alfred, NY. "Using high
temperature XRD, we determined that nickel-doped cordierite glass-ceramics are
candidates for application as permeability-controlled microporous membranes to
separate out carbon dioxide and hydrogen gases in fossil fuel power plants,
both reducing greenhouse gas emissions and generating hydrogen," explains

    Professor Misture's group studies the dynamic behavior of oxide ceramics
and glasses related to energy conversion devices. Projects generally rely on
detailed in-situ characterization using X-rays and neutrons to understand the
relationships between structure and properties. Their recent work has focused
on the effects of atmosphere and humidity on structure, phase stability, and
conductivity at high temperature.

    Their current research focuses on materials for solid oxide fuel cells
and hydrogen production. Funded by the NSF, DOE, EPA, and other agencies,
their work centers on solid oxide fuel cells and photocatalysts.

    This year's runner-up is Ph.D. student Qian Zhang from the University of
Montreal. His research paper is entitled, "A simple XRD setup to track in situ
the evolution of structural order in polymer liquid crystals exposed to
solvent vapour." Qian Zhang's research concentrates on physical and optical
studies of azo-surfactomesogen/polyelectrolyte complexes. He is advised by
Professor C. Geraldine Bazuin of the University of Montreal's Department of
Chemistry. Professor Bazuin's research concentrates on the development of
novel supramolecular and nanostructured polymeric materials. "Our particular
areas of interest include liquid crystalline materials, block copolymers,
blends, ionomers, nanopatterns on surfaces, ultrathin films, and applications
in optoelectronics and gene delivery," indicates Professor Bazuin.

    The scholarship winner and runner-up have been selected by an independent
panel of judges: Dr. Tom Blanton from Eastman Kodak; Dr. Jim Kaduk from
Innovene and current Board Chairman of the International Centre for
Diffraction Data; Dr. Pam Whitfield from National Research Council Canada; Dr.
Jim Britten from McMaster University; and Dr. Nattamai Bhuvanesh, Department
of Chemistry at Texas A&M University.

    "We are quite pleased again this year to provide a Bruker XRD scholarship
to another extraordinary student," says Uwe Preckwinkel, Bruker AXS XRD Sales
and Marketing Manager. "Both Bruker AXS and the judges are most impressed by
the quality of the XRD experiments all these future X-ray scientists have
performed, and the valuable scientific results they have obtained," adds Dr.
Frank Burgaezy, Executive Vice President of Bruker AXS in charge of the
company's global XRD and XRF business.

    Bruker AXS scientists are available at the Company's MRS Fall Meeting
booth (Number 300) to discuss the award and all the student research findings.
Bruker AXS has published the various papers on a CD now being distributed to
the press, MRS Meeting attendees, other scientists, and research libraries

    The MRS Fall Meeting is providing a unique opportunity to present
innovative products and services to over 5,000 attendees from all sectors of
the global materials science and engineering communities. For more
information, please visit

    About XRD

    X-Ray Scattering is a high-tech, non-destructive technique for analyzing
a wide range of materials, including fluids, metals, minerals, polymers,
catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics and
semiconductors. Throughout industry and research institutions, XRS & XRD have
become an indispensable method for materials investigation, characterization
and quality control. Example areas of application include qualitative and
quantitative phase analysis, crystallography, structure and relaxation
determination, texture and residual stress investigations, controlled sample
environment, micro-diffraction, nanomaterials, lab- and process automation,
and high-throughput polymorph screening.

    About Bruker AXS

    Bruker AXS, Inc. is a leading developer and provider of life science,
materials research and industrial X-ray analysis and spark-OES tools.


For further information:

For further information: Bruker AXS, Inc. Uwe Preckwinkel, 608-276-3047
XRD Sales and Marketing Manager

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